| 摘要 |
<p>The present invention is a temperature estimation device which can improve the estimate accuracy for the temperature of a semiconductor. A first temperature detection unit (31) is provided in a first position separated from a semiconductor element (10). A second temperature detection unit (32) is provided in a second position differing from the first position. The relationship between a first temperature difference between the temperature of the semiconductor element (10) and a first temperature at the first position and a second temperature difference between the first temperature and a second temperature at the second position is prerecorded in a storage unit (41). A temperature estimation unit (40) estimates the temperature of the element on the basis of the first temperature detected by the first temperature detection unit (31), the second temperature detected by the second temperature detection unit (32), and the relationship recorded in the storage unit (41).</p> |
