Provided is a capacitor which improves the current leakage characteristics by band gap engineering of a capacitor dielectric layer included in the capacitor. The capacitor comprises: a first electrode; a first dielectric layer and a second dielectric layer which are sequentially formed on the first electrode, have different impurity concentrations from each other, and are consisting of the same genetic materials; and a second electrode formed on the second dielectric layer.
申请公布号
KR20140103551(A)
申请公布日期
2014.08.27
申请号
KR20130017066
申请日期
2013.02.18
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
LIM, HAN JIN;NAM, SEOK WOO;OH, JUNG HWAN;IM, KI VIN