发明名称 CAPACITOR AND SEMICONDUCTOR DEVICE USING IT
摘要 Provided is a capacitor which improves the current leakage characteristics by band gap engineering of a capacitor dielectric layer included in the capacitor. The capacitor comprises: a first electrode; a first dielectric layer and a second dielectric layer which are sequentially formed on the first electrode, have different impurity concentrations from each other, and are consisting of the same genetic materials; and a second electrode formed on the second dielectric layer.
申请公布号 KR20140103551(A) 申请公布日期 2014.08.27
申请号 KR20130017066 申请日期 2013.02.18
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LIM, HAN JIN;NAM, SEOK WOO;OH, JUNG HWAN;IM, KI VIN
分类号 H01L27/108;H01L21/8242 主分类号 H01L27/108
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