发明名称 APOLARIZED INTERFEROMETRIC SYSTEM, AND APOLARIZED INTERFEROMETRIC MEASUREMENT SYSTEM
摘要 <p>An interferometric system includes a polarization separation element (10), a first polarization conversion element (11), a Mach-Zehnder interferometer (2) including a first (4) and second (5) arms connected to one another by a first (6) and second (7) ends in order for a first and second beams (20, 21) having the same polarization to pass through the interferometer in a reciprocal manner in opposite directions of propagation, respectively, so as to form a first and second interferometric beam (22, 23), a second polarization conversion element (11) for obtaining an interferometric beam (24), the polarization of which is converted, a polarization-combining element (10), and a detection element (8) suitable for detecting an output beam (25).</p>
申请公布号 EP2635883(B1) 申请公布日期 2014.08.27
申请号 EP20110799746 申请日期 2011.11.02
申请人 IXBLUE 发明人 LEFEVRE, HERVÉ;MOLUCON, CÉDRIC;BONNEFOIS, JEAN-JACQUES;AUBRY, KARL
分类号 G01J9/02 主分类号 G01J9/02
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