发明名称 METHOD OF ANALYSING PHASE INFORMATION, DATA MEDIUM AND X-RAY IMAGING DEVICE
摘要 FIELD: physics.SUBSTANCE: analysis method for obtaining phase information by analysing a periodic moire structure comprises steps of: subjecting a periodic moire structure to short-time Fourier transform using a window function; separating information on a first spectrum containing phase information from information on a second spectrum superimposed on information on the first spectrum to obtain phase information using an approximation of each of the forms of the first and second spectra to the form of a predefined function. The device comprises a diffraction grating for diffraction of X-rays from an X-ray source, an absorbing grid for screening part of the diffracted X-rays, a moire detector and a calculator which extracts a phase function based on the moire in accordance with the analysis method.EFFECT: improved resolution when analysing phase information by eliminating spectrum overlapping.12 cl, 15 dwg
申请公布号 RU2526892(C2) 申请公布日期 2014.08.27
申请号 RU20120138453 申请日期 2011.01.21
申请人 KEHNON KABUSIKI KAJSJA 发明人 NAGAI KENTARO
分类号 G01B11/25;G02B27/60;G21K7/00 主分类号 G01B11/25
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