发明名称 |
MAGNETORESISTIVE STRUCTURE, MEMORY DEVICE INCLUDING THE SAME AND MANUFACTURING METHODS THEREOF |
摘要 |
<p>Disclosed are a magnetoresistive structure, a memory device including the magnetoresistive structure, and a manufacturing method thereof. The disclosed magnetoresistive structure includes a free magnetization layer; a separation layer wider than the free magnetization layer; and a fixed magnetization layer wider than the free magnetization layer. Multiple pieces of the free magnetization layer can be provided. The separation layer and the fixed magnetization layer can have a structure covering the multiple free magnetization layers. The separation layer can be arranged on the free magnetization layers, or the free magnetization layers can be arranged on the separation layer.</p> |
申请公布号 |
KR20140103771(A) |
申请公布日期 |
2014.08.27 |
申请号 |
KR20130017662 |
申请日期 |
2013.02.19 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, SUNG CHUL;KIM, KWANG SEOK;KIM, KEE WON;JANG, YOUNG MAN;PI, UNG HWAN |
分类号 |
G11C11/15;H01L21/8247;H01L27/115 |
主分类号 |
G11C11/15 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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