发明名称 Semiconductor device and method of manufacturing the same
摘要 A method comprising, introducing a dopant type into a semiconductor layer to define a well region of the semiconductor layer, the well region comprising a channel region, and introducing a dopant type into the well region to define a multiple implant region substantially coinciding with the well region but excluding the channel region.
申请公布号 US8815721(B2) 申请公布日期 2014.08.26
申请号 US201012971188 申请日期 2010.12.17
申请人 General Electric Company 发明人 Stum Zachary Matthew;Arthur Stephen Daley;Matocha Kevin Sean;Losee Peter Almern
分类号 H01L21/425;H01L21/04;H01L29/66;H01L29/78 主分类号 H01L21/425
代理机构 代理人 Asmus Scott J.
主权项 1. A method comprising: performing an initial ion implantation process to implant a first dopant type into a semiconductor layer to define a well region of the semiconductor layer, the well region comprising a channel region and a region for multiple ion implantation; disposing a mask over the channel region, wherein the mask does not extend over the region for multiple ion implantation; and performing a subsequent ion implantation process, while the mask is disposed over the channel region, to implant the first dopant type into the region for multiple ion implantation to define a multiple implant region substantially coinciding with the well region but excluding the channel region.
地址 Niskayuna NY US
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