发明名称 |
Semiconductor device and method of manufacturing the same |
摘要 |
A method comprising, introducing a dopant type into a semiconductor layer to define a well region of the semiconductor layer, the well region comprising a channel region, and introducing a dopant type into the well region to define a multiple implant region substantially coinciding with the well region but excluding the channel region. |
申请公布号 |
US8815721(B2) |
申请公布日期 |
2014.08.26 |
申请号 |
US201012971188 |
申请日期 |
2010.12.17 |
申请人 |
General Electric Company |
发明人 |
Stum Zachary Matthew;Arthur Stephen Daley;Matocha Kevin Sean;Losee Peter Almern |
分类号 |
H01L21/425;H01L21/04;H01L29/66;H01L29/78 |
主分类号 |
H01L21/425 |
代理机构 |
|
代理人 |
Asmus Scott J. |
主权项 |
1. A method comprising:
performing an initial ion implantation process to implant a first dopant type into a semiconductor layer to define a well region of the semiconductor layer, the well region comprising a channel region and a region for multiple ion implantation; disposing a mask over the channel region, wherein the mask does not extend over the region for multiple ion implantation; and performing a subsequent ion implantation process, while the mask is disposed over the channel region, to implant the first dopant type into the region for multiple ion implantation to define a multiple implant region substantially coinciding with the well region but excluding the channel region. |
地址 |
Niskayuna NY US |