发明名称 |
Bulk finFET with super steep retrograde well |
摘要 |
A method for forming a fin transistor in a bulk substrate includes forming a super steep retrograde well (SSRW) on a bulk substrate. The well includes a doped portion of a first conductivity type dopant formed below an undoped layer. A fin material is grown over the undoped layer. A fin structure is formed from the fin material, and the fin material is undoped or doped. Source and drain regions are provided adjacent to the fin structure to form a fin field effect transistor. |
申请公布号 |
US8815684(B2) |
申请公布日期 |
2014.08.26 |
申请号 |
US201213708531 |
申请日期 |
2012.12.07 |
申请人 |
International Business Machines Corporation |
发明人 |
Cai Jin;Chan Kevin K.;Dennard Robert H.;Doris Bruce B.;Linder Barry P.;Muralidhar Ramachandran;Shahidi Ghavam G. |
分类号 |
H01L21/205;H01L21/285 |
主分类号 |
H01L21/205 |
代理机构 |
Tutunjian & Bitetto, P.C. |
代理人 |
Tutunjian & Bitetto, P.C. ;Alexanian Vazken |
主权项 |
1. A method for forming a fin transistor with a bulk substrate, comprising:
forming a super steep retrograde well (SSRW) in or on a bulk substrate, the well including a doped portion of a first conductivity type dopant and being formed in the bulk substrate below an undoped layer, the SSRW being formed beneath a location corresponding to a fin structure, wherein forming the super steep retrograde well (SSRW) includes epitaxially growing the SSRW to include at least one diffusion barrier; growing a fin material over the undoped layer; forming the fin structure from the fin material; forming a gate structure over the fin structure; and forming source and drain regions adjacent to the fin structure to form a fin field effect transistor. |
地址 |
Armonk NY US |