发明名称 Bulk finFET with super steep retrograde well
摘要 A method for forming a fin transistor in a bulk substrate includes forming a super steep retrograde well (SSRW) on a bulk substrate. The well includes a doped portion of a first conductivity type dopant formed below an undoped layer. A fin material is grown over the undoped layer. A fin structure is formed from the fin material, and the fin material is undoped or doped. Source and drain regions are provided adjacent to the fin structure to form a fin field effect transistor.
申请公布号 US8815684(B2) 申请公布日期 2014.08.26
申请号 US201213708531 申请日期 2012.12.07
申请人 International Business Machines Corporation 发明人 Cai Jin;Chan Kevin K.;Dennard Robert H.;Doris Bruce B.;Linder Barry P.;Muralidhar Ramachandran;Shahidi Ghavam G.
分类号 H01L21/205;H01L21/285 主分类号 H01L21/205
代理机构 Tutunjian & Bitetto, P.C. 代理人 Tutunjian & Bitetto, P.C. ;Alexanian Vazken
主权项 1. A method for forming a fin transistor with a bulk substrate, comprising: forming a super steep retrograde well (SSRW) in or on a bulk substrate, the well including a doped portion of a first conductivity type dopant and being formed in the bulk substrate below an undoped layer, the SSRW being formed beneath a location corresponding to a fin structure, wherein forming the super steep retrograde well (SSRW) includes epitaxially growing the SSRW to include at least one diffusion barrier; growing a fin material over the undoped layer; forming the fin structure from the fin material; forming a gate structure over the fin structure; and forming source and drain regions adjacent to the fin structure to form a fin field effect transistor.
地址 Armonk NY US