| 发明名称 |
Amplifier calibration |
| 摘要 |
A system and method of calibrating an amplifier are presented. The amplifier has a first amplification path and a second amplification path. A first state of the amplifier is identified defining a first phase shift of the first path and a second phase shift of the second path resulting in a maximum efficiency of the amplifier when an attenuation of the first path and an attenuation of the second path are set to first attenuation values. The attenuation of the first path and the attenuation of the second path is set to achieve a maximum efficiency of the amplifier when the phase shift of the first path and the phase shift of the second path are set according to the first state. |
| 申请公布号 |
US8816767(B2) |
申请公布日期 |
2014.08.26 |
| 申请号 |
US201414152081 |
申请日期 |
2014.01.10 |
| 申请人 |
Freescale Semiconductor, Inc. |
发明人 |
Ahmed Abdulrhman M. S.;Hart Paul R.;Embar Ramanujam Shinidhi |
| 分类号 |
H03F3/68;H03F1/36 |
主分类号 |
H03F3/68 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method of calibrating an amplifier having a first path and a second path, the method comprising:
identifying a first state of the amplifier defining a first phase shift of the first path and a second phase shift of the second path resulting in a maximum efficiency of the amplifier when an attenuation of the first path and an attenuation of the second path are set to first attenuation values; and setting the attenuation of the first path and the attenuation of the second path to achieve a maximum efficiency of the amplifier when the phase shift of the first path and the phase shift of the second path are set according to the first state. |
| 地址 |
Austin TX US |
