发明名称 INDUCTIVELY COUPLED PLASMA PROCESSING APPARATUS
摘要 <p>PROBLEM TO BE SOLVED: To provide an inductively coupled plasma processing apparatus that is capable of performing uniform plasma processing on a large-sized processing target substrate using a metal window.SOLUTION: An inductively coupled plasma processing apparatus, which performs inductively coupled plasma processing on a rectangular substrate, includes: a processing chamber in which the substrate is accommodated; a high-frequency antenna for generating inductively coupled plasma in the processing chamber; and a metal window 2 arranged between a plasma generation area, in which the inductively coupled plasma is generated, and the high-frequency antenna and provided so as to correspond to the substrate. The metal window 2 is divided into a plurality of areas by slits 7 and has long-side side areas 202b corresponding to long sides 2b and short-side side areas 202a corresponding to short sides 2a. Outer slits 71, out of the slits 7, have short-side side portions 71a corresponding to the short-side side areas 202a and long-side side portions 71b corresponding to the long-side side areas 202b, with a width of the short-side side portions 71a being wider than that of the long-side side portions 71b.</p>
申请公布号 JP2014154684(A) 申请公布日期 2014.08.25
申请号 JP20130022544 申请日期 2013.02.07
申请人 TOKYO ELECTRON LTD 发明人 YAMAZAWA YOHEI;SASAKI KAZUO;FURUYA ATSUKI;SAITO HITOSHI
分类号 H01L21/3065;C23C16/505;H05H1/46 主分类号 H01L21/3065
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