发明名称 |
APPARATUS WITH VARIABLE RESISTANCE MEMORY CELLS AND METHOD OF OPTIMIZING VARIABLE RESISTANCE MEMORY CELLS |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide an apparatus with variable resistance memory cells and a method of optimizing the variable resistance memory cells.SOLUTION: A data storage device is generally constructed and operated with at least one variable resistance memory cell configured with non-factory shipment time operational parameters by a controller. The non-factory shipment time operational parameters are assigned in response to identified variance from a predetermined threshold in at least one variable resistance memory cell.</p> |
申请公布号 |
JP2014154206(A) |
申请公布日期 |
2014.08.25 |
申请号 |
JP20140022182 |
申请日期 |
2014.02.07 |
申请人 |
SEAGATE TECHNOLOGY LLC |
发明人 |
KHOUEIR ANTOINE;MARK ALLEN GAERTNER;RYAN JAMES GOSS |
分类号 |
G11C13/00;H01L27/105;H01L45/00;H01L49/00 |
主分类号 |
G11C13/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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