发明名称 APPARATUS WITH VARIABLE RESISTANCE MEMORY CELLS AND METHOD OF OPTIMIZING VARIABLE RESISTANCE MEMORY CELLS
摘要 <p>PROBLEM TO BE SOLVED: To provide an apparatus with variable resistance memory cells and a method of optimizing the variable resistance memory cells.SOLUTION: A data storage device is generally constructed and operated with at least one variable resistance memory cell configured with non-factory shipment time operational parameters by a controller. The non-factory shipment time operational parameters are assigned in response to identified variance from a predetermined threshold in at least one variable resistance memory cell.</p>
申请公布号 JP2014154206(A) 申请公布日期 2014.08.25
申请号 JP20140022182 申请日期 2014.02.07
申请人 SEAGATE TECHNOLOGY LLC 发明人 KHOUEIR ANTOINE;MARK ALLEN GAERTNER;RYAN JAMES GOSS
分类号 G11C13/00;H01L27/105;H01L45/00;H01L49/00 主分类号 G11C13/00
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