MEMORY DEVICE INSPECTION SYSTEM, MEMORY DEVICE INSPECTION METHOD, AND NONVOLATILE SEMICONDUCTOR MEMORY DEVICE

摘要

PROBLEM TO BE SOLVED: To provide an improved technique for memory access control.SOLUTION: An inspection system 1 performs a pre-operation inspection prior to the actual use of a nonvolatile semiconductor memory device 10. In the pre-operation inspection, a control unit 31 causes the memory device 10 to write and read predetermined data. An inspection error correction unit 34 performs error correction to the predetermined read data. The control unit 31 applies a predetermined sorting reference to a result of the error correction to the predetermined data, thereby sorting out a not-good block. The control unit 31 registers the sorted-out not-good block in block information 14a in the memory device 10. The memory control unit 15 determines the not-good block on the basis of the block information 14a; and controls access to a memory array 11 while applying measures for the not-good block.