发明名称 COMPOUND, POLYMERIC COMPOUND, RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN
摘要 PROBLEM TO BE SOLVED: To provide a compound that is useful for improving lithography characteristics, a polymeric compound derived from the compound, a resist composition comprising the polymeric compound, and a method for forming a pattern.SOLUTION: The compound is expressed by general formula (a0-1) below. In the formula, Rrepresents H or an alkyl group having 1 to 5 carbon atoms, or a halogenated alkyl group having 1 to 5 carbon atoms; Yand Yrepresent a single bond or a divalent connecting group; Rand Rrepresent a functional group or a group expressed by formula (1-an1), (1-an2) or (1-an3); n1 represents an integer of 0 to 2; n2 represents 0 or 1; Y1 represents a single bond or -SO-; Rrepresents a cyclic group which may have a substituent, a linear alkyl group which may have a substituent, or a linear alkenyl group which may have a substituent; and Xrepresents an organic cation or a metal cation.
申请公布号 JP2014152122(A) 申请公布日期 2014.08.25
申请号 JP20130020941 申请日期 2013.02.05
申请人 TOKYO OHKA KOGYO CO LTD 发明人 KAWAKAMI AKINARI;UTSUMI YOSHIYUKI
分类号 C07C309/12;C07C25/00;C07C309/19;C07C309/42;C07C309/43;C07C311/09;C07C311/48;C07C381/12;C09K3/00;G03F7/004;G03F7/039;H01L21/027 主分类号 C07C309/12
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