| 摘要 |
PROBLEM TO BE SOLVED: To easily test a parity check function in devices under test. ! SOLUTION: A testing apparatus that tests devices under test is provided, which comprises: a pattern generation unit that generates a parity signal for detecting an error in a test pattern, on the basis of the test pattern that is to be input to the devices under test; and a signal output unit that outputs the test pattern and parity signal in association with each other. The signal output unit has a plurality of selection output units that receive the test pattern and parity signal, select for each cycle a bit corresponding to a selection signal out of the bits of the test pattern and parity signal, and output it. ! COPYRIGHT: (C)2014,JPO&INPIT |
