| 摘要 |
Provided is a method for producing a circular wafer by using a grinding tape to grind the edge of a wafer comprising a crystalline material. The present invention includes: a primary grinding step for contacting a grinding body to the peripheral portion of a wafer placed centered on a horizontal stage having a vertical rotational axis and rotating the stage, thus grinding the peripheral portion; a step for measuring the radius of the wafer, setting a radius that is no greater than the measured smallest radius, and determining the difference (&Dgr;r) between the set radius and the measured wafer radius along the peripheral portion; a step for determining the portions of the peripheral portion at which &Dgr;r is greater than a predetermined value; and a secondary grinding step for contacting the peripheral portion and the grinding body, rotating the stage forwards and backwards in a predetermined range of rotational angles, and grinding the peripheral portion. The grinding body contains a grinding tape disposed at a flat grinding pad and demarcating a flat grinding surface, and in the secondary grinding step, the stage and grinding surface are rocked relative to each other along a horizontal axis line, reducing the speed of the forward and backward rotation of the stage within a range of rotational angles corresponding to the determined section of the peripheral portion. |
