发明名称 Manufacturing a Super Junction Semiconductor Device and Semiconductor Device
摘要 A super junction semiconductor device includes a semiconductor portion with a first surface and a parallel second surface. A doped layer of a first conductivity type is formed at least in a cell area. Columnar first super junction regions of a second, opposite conductivity type extend in a direction perpendicular to the first surface. Columnar second super junction regions of the first conductivity type separate the first super junction regions from each other. The first and second super junction regions form a super junction structure between the first surface and the doped layer. A distance between the first super junction regions and the second surface does not exceed 30 μm. The on-state or forward resistance of low-voltage devices rated for reverse breakdown voltages below 1000 V can be defined by the resistance of the super junction structure.
申请公布号 US2014231910(A1) 申请公布日期 2014.08.21
申请号 US201313769619 申请日期 2013.02.18
申请人 INFINEON TECHNOLOGIES AUSTRIA AG 发明人 Willmeroth Armin;Hirler Franz;Schulze Hans-Joachim;Wahl Uwe;Kaindl Winfried
分类号 H01L29/06;H01L29/66;H01L29/78 主分类号 H01L29/06
代理机构 代理人
主权项 1. A super junction semiconductor device comprising: a semiconductor portion with a first surface and a second surface parallel to the first surface and comprising a doped layer of a first conductivity type formed at least in a cell area; and columnar first super junction regions of a second, opposite conductivity type extending in a direction perpendicular to the first surface and separated by columnar second super junction regions of the first conductivity type, the first and second super junction regions forming a super junction structure between the first surface and the doped layer, wherein a distance between the first super junction regions and the second surface does not exceed 30 μm.
地址 Villach AT