发明名称 |
NOISE REDUCTION ELECTRON BEAM DEVICE, AND ELECTRON BEAM NOISE REDUCTION METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide an electron beam device and method capable of reducing noise in an image signal caused by emission noise to form an image with high SN-ratio.SOLUTION: A part of an electron beam is shielded by an objective aperture 5 arranged below a condenser lens 2, and the generated reflection electron beam 6 is detected by an MCP 4 to calculate a noise reduction signal. A phase and an amplitude of the noise reduction signal are adjusted by a noise reduction device 25 so that an SN ratio of an image signal by a secondary electron 21 generated from a sample by electron beam scanning becomes the maximum. |
申请公布号 |
JP2014150002(A) |
申请公布日期 |
2014.08.21 |
申请号 |
JP20130018880 |
申请日期 |
2013.02.01 |
申请人 |
HORON:KK |
发明人 |
YAMADA KEIZO |
分类号 |
H01J37/244;H01J37/09;H01J37/22;H01J37/28 |
主分类号 |
H01J37/244 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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