发明名称 METHOD OF MANUFACTURING FLAKE-LIKE OXIDE SEMICONDUCTOR, METHOD OF MANUFACTURING OXIDE SEMICONDUCTOR FILM, METHOD OF MANUFACTURING THIN-FILM TRANSISTOR, AND METHOD OF FORMING PIXEL ELECTRODE OF LIQUID CRYSTAL DISPLAY DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing a flake-like oxide semiconductor, a method of manufacturing an oxide semiconductor film, a method of manufacturing a thin-film transistor, and a method of forming a pixel electrode of a liquid crystal display device, capable of forming a high-performance oxide semiconductor film on a substrate at a low temperature.SOLUTION: A method of manufacturing a flake-like oxide semiconductor includes: immersing a substrate having a swelling property to predetermined liquid and having an oxide semiconductor film formed thereon into the liquid, and thereby, peeling the oxide semiconductor film from the substrate; and dispersing the peeled oxide semiconductor film into the liquid to make it flaky.
申请公布号 JP2014150184(A) 申请公布日期 2014.08.21
申请号 JP20130018647 申请日期 2013.02.01
申请人 NIKON CORP 发明人 NAKAZUMI MAKOTO;NISHI YASUTAKA;TAKI YUSUKE
分类号 H01L21/368;C01G9/02;G02F1/1368;G09F9/30;H01L21/336;H01L29/786 主分类号 H01L21/368
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