| 摘要 |
<p>The invention provides aterahertz scanning probe microscope setup comprising (i) a terahertz radiation source configured to generate terahertz radiation; (ii) a terahertz lens configured to receive at least part of the terahertz radiation from the terahertz radiation source; (iii) a cantilever unit comprising a cantilever with at its distal end an electrically conductive tip, a slot-line basedleaky wave antenna configured to receive at least part of the focused terahertz radiation, a stripline electrode with a terahertz radiation receiving part wave antenna and with a tip part in electrical conductive connection with the electrically conductive tip; (iv) a terahertz radiation receiver, configured to receive via the leaky wave antenna returning terahertz radiation from a sample.</p> |
