发明名称 SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION BASED ON MULTIPLE REFERENCES
摘要 A defect detection system for computerized detection of defects, the system including: an interface for receiving inspection image data including information of an analyzed pixel and of a plurality of reference pixels; and a processor, including: a differences analysis module, configured to: (a) calculate differences based on an inspected value representative of the analyzed pixel and on multiple reference values, each of which is representative of a reference pixel among the plurality of reference pixels; wherein the differences analysis module is configured to calculate for each of the reference pixels a difference between the reference value of the reference pixel and the inspected value; and (b) compute a representative difference value based on a plurality of the differences; and a defect analysis module, configured to determine a presence of a defect in the analyzed pixel based on the representative difference value.
申请公布号 US2014233844(A1) 申请公布日期 2014.08.21
申请号 US201313773535 申请日期 2013.02.21
申请人 Amzaleg Moshe;Cohen Yehuda;Ben-David Nir;Rozenman Efrat 发明人 Amzaleg Moshe;Cohen Yehuda;Ben-David Nir;Rozenman Efrat
分类号 G06K9/00 主分类号 G06K9/00
代理机构 代理人
主权项 1. A defect detection system for computerized detection of defects in an inspected object based on processing of an inspection image generated by collecting signals arriving from the inspected object, the system comprising: an interface for receiving inspection image data including information of an analyzed pixel and of a plurality of reference pixels; and a processor, comprising: a differences analysis module, configured to: (a) calculate differences based on an inspected value representative of the analyzed pixel and on multiple reference values, each of which is representative of a reference pixel among the plurality of reference pixels; wherein the differences analysis module is configured to calculate for each of the reference pixels a difference between the reference value of the reference pixel and the inspected value; and(b) compute a representative difference value based on a plurality of the differences; anda defect analysis module, configured to determine a presence of a defect in the analyzed pixel based on the representative difference value.
地址 Beer Sheva IL