发明名称 TEST DATA GENERATING DEVICE
摘要 <p>In an inputted parameter data (20) logic structure, an AND-AND hierarchy leveling means (4) switches a condition of a portion wherein an AND relation and an AND relation are contiguous from a subject node as a hierarchy, and deletes a subject child node (Ta). An OR-OR hierarchy leveling means (6) switches a condition of a portion wherein an OR relation and an OR relation are contiguous from a subject node as a hierarchy, and deletes a subject child node (ISR). A raising leveling means (8) finds a portion (34) wherein the AND relation and the OR relation are contiguous from the subject node (Ta) as a lower-order hierarchy and the OR relation and the AND relation are contiguous from the subject node as a higher-order hierarchy, switches the condition, and carries out leveling. It is thus possible to obtain standardized parameter data.</p>
申请公布号 WO2014125836(A1) 申请公布日期 2014.08.21
申请号 WO2014JP00777 申请日期 2014.02.14
申请人 NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCEAND TECHNOLOGY 发明人 KITAMURA, TAKASHI;DO, THI BICH NGOC;OHSAKI, HITOSHI
分类号 G06F11/28 主分类号 G06F11/28
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