发明名称 |
TEST DATA GENERATING DEVICE |
摘要 |
<p>In an inputted parameter data (20) logic structure, an AND-AND hierarchy leveling means (4) switches a condition of a portion wherein an AND relation and an AND relation are contiguous from a subject node as a hierarchy, and deletes a subject child node (Ta). An OR-OR hierarchy leveling means (6) switches a condition of a portion wherein an OR relation and an OR relation are contiguous from a subject node as a hierarchy, and deletes a subject child node (ISR). A raising leveling means (8) finds a portion (34) wherein the AND relation and the OR relation are contiguous from the subject node (Ta) as a lower-order hierarchy and the OR relation and the AND relation are contiguous from the subject node as a higher-order hierarchy, switches the condition, and carries out leveling. It is thus possible to obtain standardized parameter data.</p> |
申请公布号 |
WO2014125836(A1) |
申请公布日期 |
2014.08.21 |
申请号 |
WO2014JP00777 |
申请日期 |
2014.02.14 |
申请人 |
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCEAND TECHNOLOGY |
发明人 |
KITAMURA, TAKASHI;DO, THI BICH NGOC;OHSAKI, HITOSHI |
分类号 |
G06F11/28 |
主分类号 |
G06F11/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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