| 摘要 |
PROBLEM TO BE SOLVED: To provide a self-calibration method of a microscope device.SOLUTION: A calibration mode is executed, an image 50 of a subject is captured by a detector device at a known reference magnification value of an optical enlargement system, at least two characteristic reference points 32a and 32b are determined in the image 50, a distance between the at least two characteristic points 32a and 32b is determined as a reference distance 34 in the image 50, and a correlation value in between the reference distance 34 and the reference magnification value is determined. Thereafter, a measurement mode is implemented, a current image of the subject is captured by the detector device at a second magnification value of the optical enlargement system, at least two characteristic reference points are discriminated in the current image, a current distance between the characteristic reference points is determined in the current image, and the second magnification value is determined from the current distance on the basis of the correlation value between the reference distance 34 and the reference magnification value. |
