发明名称 APPARATUS FOR HIGH SPEED ROM CELLS
摘要 A ROM cell comprises a first first-level contact formed on a first active region of a transistor of a memory cell, a second first-level contact formed on a second active region of the transistor of the memory cell, wherein the second first-level contact is coupled to a first VSS line and a second VSS line formed in a first interconnect layer, wherein the second VSS line is electrically coupled to the first VSS line, and wherein the second VSS line is of a direction orthogonal to a direction of the first VSS line. The ROM cell further comprises a first bit line formed in the first interconnect layer, wherein the first bit line is formed in parallel with the second VSS line and a second bit line formed in the first interconnect layer, wherein the second bit line is formed in parallel with the second VSS line.
申请公布号 US2014231921(A1) 申请公布日期 2014.08.21
申请号 US201414263634 申请日期 2014.04.28
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Liaw Jhon-Jhy
分类号 H01L27/112;H01L29/78 主分类号 H01L27/112
代理机构 代理人
主权项 1. An apparatus comprising: a first first-level contact formed on a first active region of a transistor of a memory cell; a second first-level contact formed on a second active region of the transistor of the memory cell, wherein the second first-level contact is coupled to a first VSS line; and a second VSS line formed in a first interconnect layer, wherein the second VSS line is electrically coupled to the first VSS line, and wherein the second VSS line is of a direction orthogonal to a direction of the first VSS line; a first bit line formed in the first interconnect layer, wherein the first bit line is formed in parallel with the second VSS line; and a second bit line formed in the first interconnect layer, wherein the second bit line is formed in parallel with the second VSS line.
地址 Hsin-Chu TW