发明名称 |
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE |
摘要 |
A nonvolatile semiconductor memory device according to an embodiment includes: a semiconductor layer; a block insulating layer; an organic molecular layer, which is formed between the semiconductor layer and the block insulating layer, and contains first organic molecules and second organic molecules, and in which the first organic molecule has a first alkyl chain or a first alkyl halide chain on the semiconductor layer side and a charge trapping unit on the block insulating layer side, and the second organic molecule has a second alkyl chain or a second alkyl halide chain on the semiconductor layer side and a hydroxy group, an ether group, a carboxyl group or an ester group on the block insulating layer side; and a control gate electrode formed on the block insulating layer. |
申请公布号 |
US2014231897(A1) |
申请公布日期 |
2014.08.21 |
申请号 |
US201313930183 |
申请日期 |
2013.06.28 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
TERAI Masaya;Hattori Shigeki;Watanabe Takatoshi;Yamagiwa Masakazu;Lin Wangying;Asakawa Koji |
分类号 |
H01L29/792 |
主分类号 |
H01L29/792 |
代理机构 |
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代理人 |
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主权项 |
1. A nonvolatile semiconductor memory device, comprising:
a semiconductor layer; a block insulating layer; an organic molecular layer formed between the semiconductor layer and the block insulating layer, the organic molecular layer having first organic molecules and second organic molecules, the first organic molecule having a first alkyl chain or a first alkyl halide chain on the semiconductor layer side and a charge trapping unit on the block insulating layer side, and the second organic molecule having a second alkyl chain or a second alkyl halide chain on the semiconductor layer side and a hydroxy group, an ether group, a carboxyl group or an ester group on the block insulating layer side; and a control gate electrode formed on the block insulating layer. |
地址 |
Minato-ku JP |