| 摘要 |
FIELD: physics, optics.SUBSTANCE: invention relates to optical measurements and is intended for measuring changes in refraction index and birefringence caused by nonlinear effects. The system consists of a femtosecond laser (FS), a photonic optical fibre (SF), two optical channels (KO1, KO2) and an interferometric system, particularly in a form of a VAWI interferometer. The first optical channel (KO1) includes a monochromator (MCR) with a condenser (K) forming the measurement beam. The monochromator (MCR) at the input is connected to the photonic optical fibre (SF). The mirror system of the second optical channel (KO2) includes the moveable mirror (ZP) which changes the optical path length of the second beam in the second optical channel (KO2). The test material (M) is placed in the measurement area situated at the intersection of the measurement beam and the second beam transmitted through the optical channel (KO2).EFFECT: invention increases the accuracy of measuring parameters of optical materials in regions smaller than a few micrometres.5 cl, 1 dwg |
