发明名称
摘要 There is provided a semiconductor wafer having a base wafer, an insulating layer, and a SixGe1-x crystal layer (0≰x<1) in the stated order. Here, at least a partial region of the SixGe1-x crystal layer (0≰x<1) has been subjected to annealing, and the semiconductor wafer comprises a compound semiconductor that has a lattice match or a pseudo lattice match with the at least partial region of the SixGe1-x crystal layer (0≰x<1). Furthermore, there is provided an electronic device including a substrate, an insulating layer disposed on the substrate, a SixGe1-x crystal layer (0≰x<1) disposed on the insulating layer, at least a partial region of the SixGe1-x crystal layer (0≰x<1) having been subjected to annealing, a compound semiconductor that has a lattice match or a pseudo lattice match with the at least partial region of the SixGe1-x crystal layer (0≰x<1), and a semiconductor device formed using the compound semiconductor.
申请公布号 JP5575447(B2) 申请公布日期 2014.08.20
申请号 JP20090229217 申请日期 2009.10.01
申请人 发明人
分类号 H01L21/20;H01L21/331;H01L21/336;H01L21/8222;H01L21/8234;H01L21/8248;H01L27/06;H01L27/08;H01L27/082;H01L27/088;H01L29/737;H01L29/786 主分类号 H01L21/20
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