Device and method for removing tested semiconductor elements

摘要

The device has an actuation device (14) arranged above a clamping carrier (1), which moves clamping elements into opening position for enabling the carrier to be discharged and into rest position after discharge. An intermediate carrier (13) is positioned under the clamping carrier onto which the clamping carrier is emptied during discharge. A data memory stores data about a semiconductor component (2). A removal device (16) removes the components from the intermediate carrier and sorts the components into categories in accordance with the data stored in the memory. An independent claim is also included for a method for removing tested semiconductor components from a clamping carrier.