发明名称 Light sensor having IR cut interference filter with color filter integrated on-chip
摘要 Techniques are described to furnish a light sensor that includes a patterned IR interference filter integrated with a patterned color pass filter. In one or more implementations, the light sensor includes a substrate having a surface. An IR interference filter configured to block infrared light is disposed over the surface of the substrate. The light sensor also includes one or more color pass filters placed above or below the IR interference filter. The color pass filters are configured to filter visible light to pass light in a limited spectrum of wavelengths to the one or more photodetectors.
申请公布号 US8809099(B2) 申请公布日期 2014.08.19
申请号 US201314044284 申请日期 2013.10.02
申请人 Maxim Integrated Products, Inc. 发明人 Wang Zhihai;Kerness Nicole D.;Barnett Stanley
分类号 H01L21/00 主分类号 H01L21/00
代理机构 Advent, LLP 代理人 Advent, LLP
主权项 1. A light sensor comprising: a substrate having a surface; one or more photodetectors disposed proximate to the substrate and configured to detect light and to provide a signal in response thereto; one or more color pass filters disposed proximate to the surface, the one or more color pass filters configured to filter visible light to pass light in a limited spectrum of wavelengths to the one or more photodetectors; an IR cut interference filter disposed over the one or more photodetectors, the IR cut interference filter configured to filter infrared light to at least substantially block infrared light from reaching the one or more photodetectors; an insulation layer disposed over the surface such that the insulation layer substantially encloses the one or more color pass filters and the IR cut interference filter.
地址 San Jose CA US