发明名称 Semiconductor device and method for fabricating the same
摘要 An exemplary semiconductor device comprises a through silicon via penetrating a semiconductor substrate including a circuit pattern on one side of the substrate, a first doped layer formed in the other side, and a bump connected with the through silicon via.
申请公布号 US8810010(B2) 申请公布日期 2014.08.19
申请号 US201213719099 申请日期 2012.12.18
申请人 SK Hynix Inc. 发明人 Kim Jae Bum
分类号 H01L29/06;H01L23/48;H01L21/48 主分类号 H01L29/06
代理机构 代理人
主权项 1. A semiconductor device, comprising: a semiconductor substrate having a first conductivity; a plurality of metal lines disposed on a first side of the semiconductor substrate; a through silicon via penetrating the semiconductor substrate; a first doped layer disposed in a second side of the semiconductor substrate, the first doped layer having a second conductivity by implanted ions; a second doped layer disposed on the first doped layer and having the first conductivity; and a bump disposed on the second side of the semiconductor substrate and coupled to the through silicon via.
地址 Icheon KR
您可能感兴趣的专利