发明名称 |
Semiconductor device and method for fabricating the same |
摘要 |
An exemplary semiconductor device comprises a through silicon via penetrating a semiconductor substrate including a circuit pattern on one side of the substrate, a first doped layer formed in the other side, and a bump connected with the through silicon via. |
申请公布号 |
US8810010(B2) |
申请公布日期 |
2014.08.19 |
申请号 |
US201213719099 |
申请日期 |
2012.12.18 |
申请人 |
SK Hynix Inc. |
发明人 |
Kim Jae Bum |
分类号 |
H01L29/06;H01L23/48;H01L21/48 |
主分类号 |
H01L29/06 |
代理机构 |
|
代理人 |
|
主权项 |
1. A semiconductor device, comprising:
a semiconductor substrate having a first conductivity; a plurality of metal lines disposed on a first side of the semiconductor substrate; a through silicon via penetrating the semiconductor substrate; a first doped layer disposed in a second side of the semiconductor substrate, the first doped layer having a second conductivity by implanted ions; a second doped layer disposed on the first doped layer and having the first conductivity; and a bump disposed on the second side of the semiconductor substrate and coupled to the through silicon via. |
地址 |
Icheon KR |