发明名称 Semiconductor wafer, semiconductor wafer manufacturing method, and electronic device
摘要 A high-quality GaAs-type crystal thin film using an inexpensive Si wafer with good thermal release characteristics is achieved. Provided is a semiconductor wafer comprising an Si wafer; a Ge layer that is crystal-grown on the wafer and shaped as an isolated island; a buffer layer that is crystal-grown on the Ge layer and is a group 3-5 compound semiconductor layer containing P; and a functional layer that is crystal-grown on the buffer layer. The Ge layer may be shaped as an island having a size that does not exceed double a distance moved by crystal defects as a result of annealing the Ge layer at a certain temperature for a certain time. The Ge layer may be shaped as an island having a size for which stress due to a difference relative to a thermal expansion coefficient of Si, which is material of the wafer, does not cause crystal defects when the Ge layer is annealed at a certain temperature.
申请公布号 US8809908(B2) 申请公布日期 2014.08.19
申请号 US200812811038 申请日期 2008.12.26
申请人 Sumitomo Chemical Company, Limited 发明人 Takada Tomoyuki;Yamanaka Sadanori;Hata Masahiko
分类号 H01L21/20 主分类号 H01L21/20
代理机构 Sughrue Mion, PLLC 代理人 Sughrue Mion, PLLC
主权项 1. A semiconductor wafer comprising: an Si wafer; a Ge layer that is crystal-grown on the wafer and shaped as an isolated island; a buffer layer that is crystal-grown on the Ge layer and is a group 3-5 compound semiconductor layer containing phosphorus; and a functional layer that is crystal-grown on the buffer layer.
地址 Tokyo JP