发明名称 Two-phase, water-based immersion-cooling apparatus with passive deionization
摘要 Cooling apparatuses, cooled electronic modules and methods of fabrication are provided for fluid immersion-cooling of an electronic component(s). The method includes, for instance: securing a housing about an electronic component to be cooled, the housing at least partially surrounding and forming a compartment about the electronic component to be cooled; disposing a fluid within the compartment, wherein the electronic component to be cooled is at least partially immersed within the fluid, and wherein the fluid comprises water; and providing a deionizing structure within the compartment, the deionizing structure comprising deionizing material, the deionizing material ensuring deionization of the fluid within the compartment, wherein the deionizing structure is configured to accommodate boiling of the fluid within the compartment.
申请公布号 US8806749(B2) 申请公布日期 2014.08.19
申请号 US201213684724 申请日期 2012.11.26
申请人 International Business Machines Corporation 发明人 Campbell Levi A.;Chu Richard C.;David Milnes P.;Ellsworth Michael J.;Iyengar Madhusudan K.;Simons Robert E.;Singh Prabjit
分类号 H01L23/34;H01L21/50;B21D53/02 主分类号 H01L23/34
代理机构 Helsin Rothenberg Farley & Mesiti P.C. 代理人 Chiu, Esq. Steven;Radigan, Esq. Kevin P.;Helsin Rothenberg Farley & Mesiti P.C.
主权项 1. A method of fabricating a cooled electronic module comprising: securing a housing about an electronic component to be cooled, the housing at least partially surrounding and forming a compartment about the electronic component to be cooled; disposing a fluid within the compartment, wherein the electronic component to be cooled is at least partially immersed within the fluid, and wherein the fluid comprises water; providing a deionizing structure within the compartment, the deionizing structure comprising deionizing material, the deionizing material ensuring deionization of the fluid within the compartment, wherein the deionizing structure is configured with vapor passages to accommodate boiling of the fluid within the compartment; and wherein the deionization structure disposed within the compartment at least partially surrounds and forms a secondary, boiling compartment about the electronic component to be cooled, the deionization structure comprising the vapor passages in an upper portion thereof.
地址 Armonk NY US