发明名称 Inductively coupled plasma ion source with multiple antennas for wide ion beam
摘要 A wide ion beam source includes a plurality of RF windows arranged in a predetermined relationship, a single plasma chamber disposed on a first side of the plurality of RF windows, a plurality of RF antennas, each RF antenna of the plurality of RF antennas disposed on a second side of a respective RF window of the plurality of RF windows, the second side being opposite the first side, and a plurality of RF sources, each RF source coupled to a respective RF antenna of the plurality of RF antennas, wherein a difference in frequency of a first RF signal produced by a first RF source coupled to a first RF antenna from that of a second RF signal produced by a second RF source coupled to an RF antenna adjacent to the first RF antenna is greater than 10 kHz.
申请公布号 US8809803(B2) 申请公布日期 2014.08.19
申请号 US201313961060 申请日期 2013.08.07
申请人 Varian Semiconductor Equipment Associates, Inc. 发明人 Biloiu Costel;Olson Joseph C.;Bell Edward W.;Sieradzki Manny
分类号 H01J27/00;H01J37/08 主分类号 H01J27/00
代理机构 代理人
主权项 1. A wide ion beam source comprising: a plurality of RF windows arranged in a predetermined relationship; a single plasma chamber disposed on a first side of the plurality of RF windows; a plurality of RF antennas, each RF antenna of the plurality of RF antennas disposed on a second side of a respective RF window of the plurality of RF windows, the second side being opposite the first side; and a plurality of RF sources, each RF source coupled to a respective RF antenna of the plurality of RF antennas, wherein a difference in frequency of a first RF signal produced by a first RF source coupled to a first RF antenna from that of a second RF signal produced by a second RF source coupled to an RF antenna adjacent to the first RF antenna is greater than 10 kHz.
地址 Gloucester MA US