发明名称 |
Method for manufacturing a semiconductor device comprising a guard ring between a cell region and a peripheral region |
摘要 |
A semiconductor device including a cell region and a peripheral region, the semiconductor device comprising: a guard ring region provided between the cell region and the peripheral region, the guard ring region having a barrier structure. |
申请公布号 |
US8809162(B2) |
申请公布日期 |
2014.08.19 |
申请号 |
US201012840125 |
申请日期 |
2010.07.20 |
申请人 |
Hynix Semiconductor Inc. |
发明人 |
Lee Dong Geun;Kim Sung Hyun |
分类号 |
H01L21/765;H01L21/762;H01L27/108;H01L23/58;H01L27/105;H01L27/02 |
主分类号 |
H01L21/765 |
代理机构 |
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代理人 |
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主权项 |
1. A method for manufacturing a semiconductor memory device, the method comprising:
providing a substrate having a cell region, a peripheral region, and a guard ring region provided between the cell region and the peripheral region; etching a second active region in the guard ring region to form a recess in the substrate; filling a conductive material into the recess; and depositing an insulating film within the recess over the conductive material to form a barrier gate in the second active region of the guard ring region, wherein the barrier gate has a guard ring structure surrounding the cell region, and wherein the cell region has a first active region and a first device isolation structure, the peripheral region has a second device isolation structure, and the guard ring region has the second active region between the first device isolation structure and the second device isolation structure. |
地址 |
Icheon KR |