发明名称 Method for manufacturing a semiconductor device comprising a guard ring between a cell region and a peripheral region
摘要 A semiconductor device including a cell region and a peripheral region, the semiconductor device comprising: a guard ring region provided between the cell region and the peripheral region, the guard ring region having a barrier structure.
申请公布号 US8809162(B2) 申请公布日期 2014.08.19
申请号 US201012840125 申请日期 2010.07.20
申请人 Hynix Semiconductor Inc. 发明人 Lee Dong Geun;Kim Sung Hyun
分类号 H01L21/765;H01L21/762;H01L27/108;H01L23/58;H01L27/105;H01L27/02 主分类号 H01L21/765
代理机构 代理人
主权项 1. A method for manufacturing a semiconductor memory device, the method comprising: providing a substrate having a cell region, a peripheral region, and a guard ring region provided between the cell region and the peripheral region; etching a second active region in the guard ring region to form a recess in the substrate; filling a conductive material into the recess; and depositing an insulating film within the recess over the conductive material to form a barrier gate in the second active region of the guard ring region, wherein the barrier gate has a guard ring structure surrounding the cell region, and wherein the cell region has a first active region and a first device isolation structure, the peripheral region has a second device isolation structure, and the guard ring region has the second active region between the first device isolation structure and the second device isolation structure.
地址 Icheon KR