发明名称 |
Power reduction circuit and method |
摘要 |
A method of reducing leakage current in a memory circuit is disclosed (FIG. 8A). The method includes connecting a first supply voltage terminal (VDD) to a bulk terminal of a transistor in an active mode of operation. The method further includes detecting a low power mode (SLEEP) of operation of the transistor and disconnecting the first supply voltage terminal from the bulk terminal in response to the step of detecting. |
申请公布号 |
US8811057(B1) |
申请公布日期 |
2014.08.19 |
申请号 |
US201314051946 |
申请日期 |
2013.10.11 |
申请人 |
Texas Instruments Incorporated |
发明人 |
Madan Sudhir;McAdams Hugh |
分类号 |
G11C5/14;G11C11/22 |
主分类号 |
G11C5/14 |
代理机构 |
|
代理人 |
Keagy Rose Alyssa;Telecky, Jr. Frederick J. |
主权项 |
1. A method of reducing leakage current in a memory circuit, comprising:
connecting a first supply voltage terminal to a bulk terminal of a first transistor of the memory circuit in an active mode of operation; applying a high level of a control signal to at least one terminal of a memory cell of the memory circuit; detecting a first low power mode of operation of the memory circuit; and disconnecting the first supply voltage terminal from the bulk terminal during the step of applying and floating the bulk terminal in response to the step of detecting. |
地址 |
Dallas TX US |