发明名称 Power reduction circuit and method
摘要 A method of reducing leakage current in a memory circuit is disclosed (FIG. 8A). The method includes connecting a first supply voltage terminal (VDD) to a bulk terminal of a transistor in an active mode of operation. The method further includes detecting a low power mode (SLEEP) of operation of the transistor and disconnecting the first supply voltage terminal from the bulk terminal in response to the step of detecting.
申请公布号 US8811057(B1) 申请公布日期 2014.08.19
申请号 US201314051946 申请日期 2013.10.11
申请人 Texas Instruments Incorporated 发明人 Madan Sudhir;McAdams Hugh
分类号 G11C5/14;G11C11/22 主分类号 G11C5/14
代理机构 代理人 Keagy Rose Alyssa;Telecky, Jr. Frederick J.
主权项 1. A method of reducing leakage current in a memory circuit, comprising: connecting a first supply voltage terminal to a bulk terminal of a first transistor of the memory circuit in an active mode of operation; applying a high level of a control signal to at least one terminal of a memory cell of the memory circuit; detecting a first low power mode of operation of the memory circuit; and disconnecting the first supply voltage terminal from the bulk terminal during the step of applying and floating the bulk terminal in response to the step of detecting.
地址 Dallas TX US