METHOD FOR SIMULATION OF THERMAL FAILURE AND METHOD FOR MEASURE THERMAL OF ELECTRONIC DEVICE USED IN LOW EARTH ORBIT SATELLITE

摘要

Disclosed are a thermal measurement method of an electronic device for a low earth orbit-satellite and a terminal fault simulation method. The thermal measurement method of the electronic device according to the present invention comprises a step of measuring the temperature of a case of an electronic component; a step of receiving a thermal resistance value from the junction of the electronic component to the case; a step of receiving a power loss value of the electronic component; and a step of calculating the junction temperature of the electronic component by using the measured temperature of the case, the thermal resistance value, and the power loss value.