发明名称 |
Sub-resolution assist feature arranging method and computer program product and manufacturing method of semiconductor device |
摘要 |
According to a sub-resolution assist feature arranging method in embodiments, it is selected which of a rule base and a model base is set for which pattern region on pattern data corresponding to a main pattern as a type of the method of arranging the sub-resolution assist feature for improving resolution of the main pattern formed on a substrate. Then, the sub-resolution assist feature by the rule base is arranged in a pattern region set as the rule base and the sub-resolution assist feature by the model base is arranged in a pattern region set as the model base. |
申请公布号 |
US8809072(B2) |
申请公布日期 |
2014.08.19 |
申请号 |
US201113051961 |
申请日期 |
2011.03.18 |
申请人 |
Kabushiki Kaisha Toshiba |
发明人 |
Kodama Chikaaki;Kotani Toshiya;Nojima Shigeki;Mimotogi Shoji |
分类号 |
H01L21/66;G01R31/26 |
主分类号 |
H01L21/66 |
代理机构 |
Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P. |
代理人 |
Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P. |
主权项 |
1. A sub-resolution assist feature arranging method comprising:
selecting a rule-based region within a main pattern defined by pattern data, the rule-based region being a region in which sub-resolution assist features are arranged according to a rule in a rule base; selecting a model-based region within the main pattern, the model-based region being a region in which sub-resolution assist features are arranged to a model in a model base; arranging a first sub-resolution assist feature by the rule base in the rule-based region as a rule-based sub-resolution assist feature; and arranging a second sub-resolution assist feature by the model base in the model-based region as a model-based sub-resolution assist feature, wherein a space region between the rule-based region and the model-based region is set to have a predetermined width such that:
a degree of effect of the rule-based sub-resolution assist feature on a resolution of the main pattern arranged in the model-based region is smaller than a first predetermined value, anda degree of effect of the model-based sub-resolution assist feature on a resolution of the main pattern arranged in the rule-based region is smaller than a second predetermined value. |
地址 |
Tokyo JP |