发明名称 |
Nitrogen-containing organic compound, chemically amplified positive resist composition, and patterning process |
摘要 |
An aralkylcarbamate of imidazole base is effective as the quencher. In a chemically amplified positive resist composition comprising the carbamate, deprotection reaction of carbamate takes place by reacting with the acid generated upon exposure to high-energy radiation, whereby the composition changes its basicity before and after exposure, resulting in a pattern profile with advantages including high resolution, rectangular shape, and minimized dark-bright difference. |
申请公布号 |
US8808964(B2) |
申请公布日期 |
2014.08.19 |
申请号 |
US201113217319 |
申请日期 |
2011.08.25 |
申请人 |
Shin-Etsu Chemical Co., Ltd. |
发明人 |
Sagehashi Masayoshi;Watanabe Takeru;Kobayashi Tomohiro |
分类号 |
G03F7/004 |
主分类号 |
G03F7/004 |
代理机构 |
Birch, Stewart, Kolasch & Birch, LLP |
代理人 |
Birch, Stewart, Kolasch & Birch, LLP |
主权项 |
1. A chemically amplified positive resist composition comprising:
(A) a nitrogen-containing organic compound having the general formula (3): wherein R1 is hydrogen, a straight, branched or cyclic C1-C15 alkyl group, or C6-C15 aryl group, R4 is an optionally alkoxy-substituted C6-C15 aryl group, and R10 and R11 are each independently hydrogen or C1-C6 alkyl, as a quencher, (B) an organic solvent, (C) a base resin which changes its solubility in alkaline developer under the action of an acid, and (D) a photoacid generator. |
地址 |
Tokyo JP |