发明名称 Dry metal etching method
摘要 A method of etching an aluminum-containing layer on a substrate is described. The method includes forming plasma from a process composition containing a halogen element, and exposing the substrate to the plasma to etch the aluminum-containing layer. The method may additionally include exposing the substrate to an oxygen-containing environment to oxidize a surface of the aluminum-containing layer and control an etch rate of the aluminum-containing layer. The method may further include forming first plasma from a process composition containing HBr and an additive gas having the chemical formula CxHyRz (wherein R is a halogen element, x and y are equal to unity or greater, and z is equal to zero or greater), forming second plasma from a process composition containing HBr, and exposing the substrate to the first plasma and the second plasma to etch the aluminum-containing layer.
申请公布号 US8808562(B2) 申请公布日期 2014.08.19
申请号 US201113230721 申请日期 2011.09.12
申请人 Tokyo Electron Limited 发明人 Ohsawa Yusuke;Ohtake Hiroto;Suzuki Eiji;Kumar Kaushik Arun;Metz Andrew W.
分类号 B44C1/22;H01J37/32;H01L21/3213 主分类号 B44C1/22
代理机构 Wood, Herron & Evans, LLP 代理人 Wood, Herron & Evans, LLP
主权项 1. A method for etching a metal-containing layer on a substrate, comprising: disposing a substrate having an aluminum-containing layer formed thereon in a plasma processing system; forming plasma from a process composition containing a halogen element; exposing said substrate to said plasma to etch said aluminum-containing layer while simultaneously exposing said substrate to an oxygen-containing environment to oxidize a surface of said aluminum-containing layer and control an etch rate of said aluminum-containing layer.
地址 Tokyo JP