Built-in self-test circuit for liquid crystal display source driver

摘要

A built-in self-test (BIST) circuit for a liquid crystal display (LCD) source driver includes at least one digital-to-analog converter (DAC) and at least one buffer coupled to the respective DAC, wherein the buffer is reconfigurable as a comparator. A first input signal and a second input signal are coupled to the comparator. The first input signal is a predetermined reference voltage level. The second input signal is a test offset voltage in a test range.

主权项

1. A built-in self-test (BIST) circuit for a liquid crystal display (LCD) source driver, comprising:
a plurality of digital-to-analog converters (DACs); a plurality of buffers, wherein each buffer of the plurality of buffers is configured to be coupled to a respective DAC of the plurality of DACs and at least one buffer is reconfigurable as a comparator in response to a control signal, wherein the at least one buffer is configured to be disconnected from the DAC when the buffer is reconfigured as a comparator in a first test mode; a first input signal node coupled to the comparator and configured to supply a first input signal that is a predetermined reference voltage level; and a second input signal node coupled to the comparator and configured to supply a second input signal that is a test offset voltage in a test range.