| 摘要 |
PROBLEM TO BE SOLVED: To provide a temperature-compensated measuring probe (MTS, MTE) which is received in a workpiece-machining machine (WBM), and carries out measurement in a contacting or a non-contacting manner.SOLUTION: The temperature-compensated measuring probe includes: a probing device (TE) for one-dimensional or multi-dimensional probing of a workpiece (WS); at least one probing sensor (ASE) for converting probing operation into a signal; at least one temperature sensor (TS) allocated to the measuring probe (MTS) to generate a signal (T) representing the temperature of the measuring probe (MTS); and a linking device (VE) which links at least one signal of the probing sensor (ASE) with the signal (T) of the temperature sensor (TS) to yield a temperature-compensated probing signal (TKAS) which is intended to be output to a numerical control system (NC) of a workpiece- machining machine (WBM). |
