发明名称 THREE-DIMENSIONAL SEMICONDUCTOR MEMORY DEVICES AND METHODS OF FABRICATING THE SAME
摘要 Example embodiments relate to a three-dimensional semiconductor memory device including an electrode structure on a substrate, the electrode structure including at least one conductive pattern on a lower electrode, and a semiconductor pattern extending through the electrode structure to the substrate. A vertical insulating layer may be between the semiconductor pattern and the electrode structure, and a lower insulating layer may be between the lower electrode and the substrate. The lower insulating layer may be between a bottom surface of the vertical insulating layer and a top surface of the substrate. Example embodiments related to methods for fabricating the foregoing three-dimensional semiconductor memory device.
申请公布号 US2014227841(A1) 申请公布日期 2014.08.14
申请号 US201414258436 申请日期 2014.04.22
申请人 Samsung Electronics Co., Ltd. 发明人 LEE Jaegoo;JEONG Kil-Su;KIM Hansoo;PARK Youngwoo
分类号 H01L27/115 主分类号 H01L27/115
代理机构 代理人
主权项
地址 Suwon-Si KR