发明名称 METHOD FOR MANUFACTURING COMPOSITE SUBSTRATE AND SEMICONDUCTOR WAFER USING SAID SUBSTRATE
摘要 <p>A composite substrate (1) includes: a support substrate (11) including, as a crystal phase, 35-65% by mass of a mullite phase, and 35-65% by mass of an alumina phase; and a semiconductor film (13) disposed on the main surface (11m) of the support substrate (11). A method for manufacturing a semiconductor wafer (3) includes: a step for preparing the composite substrate (1); a step for growing at least one semiconductor layer (20) on the semiconductor film (13) of the composite substrate to form a composite substrate (2) having a semiconductor layer; and a step for removing the support substrate (11) from the composite substrate (2) having a semiconductor layer to form the semiconductor wafer (3). A method is thus provided for manufacturing a composite substrate suitable for manufacturing a high-quality semiconductor wafer with high yield and good efficiency, and a semiconductor wafer using same.</p>
申请公布号 WO2014123097(A1) 申请公布日期 2014.08.14
申请号 WO2014JP52493 申请日期 2014.02.04
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 SEKI, YUKI;SATOH, ISSEI;YAMAMOTO, YOSHIYUKI;MATSUBARA, HIDEKI;SOGABE, KOICHI;HASEGAWA, MASATO;TSUJI, YUTAKA;FUJII, AKIHITO
分类号 H01L21/02;C30B25/18;C30B29/38;H01L21/20 主分类号 H01L21/02
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