发明名称 CLEANING METHOD AND CLEANING DEVICE USING OZONE WATER
摘要 PROBLEM TO BE SOLVED: To provide a cleaning method using ozone water, capable of using ozone water at a small amount and a low concentration, causing no uneven cleaning and requiring no complex device configuration.SOLUTION: In a cleaning method for a wafer using ozone water, the wafer is placed in a horizontal orientation in an immersion tray having a waste liquid port, the ozone water is supplied through a supply pipe installed above the wafer, the wafer is cleaned by being immersed into the ozone water in the immersion tray, and the ozone water is discharged through the waste liquid port.
申请公布号 JP2014146693(A) 申请公布日期 2014.08.14
申请号 JP20130014330 申请日期 2013.01.29
申请人 SHIN ETSU HANDOTAI CO LTD;MIMASU SEMICONDUCTOR INDUSTRY CO LTD 发明人 ABE TATSUO;KABASAWA HITOSHI;ARAI IZUMI
分类号 H01L21/304 主分类号 H01L21/304
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