发明名称 DYNAMIC HARD ERROR DETECTION
摘要 A method of testing a circuit includes halting a flow of normal data through the circuit, running test data through the circuit while subjecting the circuit to a stress condition, and determining whether a hard error exists in the circuit based on the running of the test data.
申请公布号 US2014229784(A1) 申请公布日期 2014.08.14
申请号 US201313969337 申请日期 2013.08.16
申请人 International Business Machines Corporation 发明人 Bose Pradip;Gara Alan;Jacobson Hans M.
分类号 G01R31/3185 主分类号 G01R31/3185
代理机构 代理人
主权项 1. A method of testing a circuit, comprising: halting a flow of normal data through the circuit; running test data through the circuit while subjecting the circuit to a stress condition; and determining whether a hard error exists in the circuit based on the running of the test data.
地址 Armonk NY US
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