发明名称 IMAGE TEST APPARATUS, IMAGE TEST SYSTEM, AND IMAGE TEST METHOD
摘要 An image test apparatus includes an image generating unit acquiring an output target image with which an image is formed and output by an image forming apparatus, and generating a test image for testing the read image, an image test unit determining a defect of the read image based on a difference between the test image and the read image, a defect number determining unit determining number of defects contained in the read image based on a determination result of the defect of the read image, a frequency distribution generating unit accumulating defect numbers of multiple read images, each of the defect numbers being the number of defects detected in one read image, and generating a frequency distribution of the defect numbers, and an abnormality determination unit determining an abnormality of the image forming apparatus based on a change in the frequency distribution generated for each predetermined period.
申请公布号 US2014226189(A1) 申请公布日期 2014.08.14
申请号 US201414177533 申请日期 2014.02.11
申请人 KOJIMA Keiji;Ishizaki Hiroyoshi 发明人 KOJIMA Keiji;Ishizaki Hiroyoshi
分类号 H04N1/00 主分类号 H04N1/00
代理机构 代理人
主权项 1. An image test apparatus that tests a read image obtained by reading an image formed and output on a sheet by an image forming apparatus, the image test apparatus comprising: an image generating unit configured to acquire an output target image with which the image is formed and output by the image forming apparatus, and generate a test image for testing the read image; an image test unit configured to determine a defect of the read image based on a difference between the test image and the read image; a defect number determining unit configured to determine number of defects contained in the read image based on a determination result of the defect of the read image; a frequency distribution generating unit configured to accumulate defect numbers of multiple read images, each of the defect numbers being the number of defects detected in one read image, and generate a frequency distribution of the defect numbers; and an abnormality determination unit configured to determine an abnormality of the image forming apparatus based on a change in the frequency distribution generated for each predetermined period.
地址 Kanagawa JP