发明名称 METHOD OF SEARCHING FOR PARAMETERIZED CONTOURS FOR COMPARING IRISES
摘要 A method for detecting outlines for iris comparison comprises a step of selecting N candidate outlines of circular form by applying a circle search technique to an image of edges of an iris. It also comprises a step of optimizing the form and the position of the N candidate outlines, the optimized candidate outlines being determined by using parametric models, a set of parameters being determined for each candidate outline by minimizing a quantity of energy E(C). The method also comprises a step of selecting the best optimized candidate outline.
申请公布号 US2014226875(A1) 申请公布日期 2014.08.14
申请号 US201214118874 申请日期 2012.05.11
申请人 Lefebvre Thierry;Lempriere Nadege;Garcia Sonia;Dorizzi Bernadette 发明人 Lefebvre Thierry;Lempriere Nadege;Garcia Sonia;Dorizzi Bernadette
分类号 G06K9/00 主分类号 G06K9/00
代理机构 代理人
主权项 1. A method for detecting outlines for iris comparison, comprising: selecting N candidate outlines of circular form by applying a circle search technique to an image of edges of an iris, optimizing the form and the position of the N candidate outlines, the optimized candidate outlines being determined by using parametric models, a set of parameters being determined for each candidate outline by minimizing a quantity of energy E(C), selecting the best optimized candidate outline.
地址 Clamart FR
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