发明名称 PLASMONIC PROJECTED DIFFRACTION SENSOR
摘要 <p>A device for detecting an analyte includes a light source emitting substantially monochromatic light; a two-dimensional diffraction element that interacts with the light from the light source, the diffraction element having one or more features that can generate plasmon waves upon receipt of the light from the light source, at least some of the features being configured to interact with the analyte; and a two-dimensional image sensor facing the diffraction element to receive diffracted light from the diffraction element so as to detect a diffraction pattern projected thereto and to measure a two-dimensional spatial change in the diffraction pattern that occurs as a result of the analyte interacting with the feature of the diffraction element.</p>
申请公布号 WO2014123613(A1) 申请公布日期 2014.08.14
申请号 WO2013US72930 申请日期 2013.12.03
申请人 INTEGRATED PLASMONICS CORPORATION 发明人 WALTERS, ROBERT JOSEPH;LEPORT, FRANCISCO RICHARD
分类号 G01N21/55;G01N21/00 主分类号 G01N21/55
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