发明名称 SYSTEMS AND METHODS FOR X-RAY SOURCE WEIGHT REDUCTION
摘要 <p>The present specification discloses an X-ray scanning system having a shield surrounding an X-ray source of an X-ray inspection system, the shield comprising a first material or a combination of the first material and a second material; and a thickness that keeps a radiation dose below a predefined limit at a plurality of locations on a boundary of a defined exclusion zone, wherein the plurality of locations change as the X-ray source moves in a scan direction, and wherein the thickness of the shield varies non-uniformly as a function of a plurality of angles of radiation. In another embodiment, the shield comprises a first inner material and a second outer material; and a thickness and a contour that keeps a radiation dose below a predefined limit at a plurality of locations on a boundary of a defined exclusion zone, wherein the plurality of locations change as the X-ray source moves in a scan direction, and wherein the thickness and contour of the shield varies non-uniformly as a function of a plurality of angles of radiation.</p>
申请公布号 WO2014124152(A2) 申请公布日期 2014.08.14
申请号 WO2014US15126 申请日期 2014.02.06
申请人 RAPISCAN SYSTEMS, INC. 发明人 LANGEVELD, WILLEM G. J.;FRANCO, EDWARD D.
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