发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To achieve a semiconductor device which reduces the need for adjustment after a soldering process and reduces a disposal loss of the semiconductor device, and which has high productivity by inhibiting solder cracks or at least and substantially reducing a depth of the crack.SOLUTION: A semiconductor device according to the present embodiment comprises: an insulating substrate which has conductive patterns on a surface and a rear face, respectively, and which is bonded to a heat spreader via solder; and a power semiconductor element bonded to on the conductive pattern on the surface side of the insulating substrate, in which the heat spreader has a plurality of first dimples on a solder bonded surface with the insulating substrate, which are arranged along a peripheral part of the insulating substrate.
申请公布号 JP2014146645(A) 申请公布日期 2014.08.14
申请号 JP20130013141 申请日期 2013.01.28
申请人 MITSUBISHI ELECTRIC CORP 发明人 ASAJI NOBUHIRO;SUDO SHINGO
分类号 H01L23/36;H01L23/40 主分类号 H01L23/36
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