发明名称 |
COPPER PILLAR FULL METAL VIA ELECTRICAL CIRCUIT STRUCTURE |
摘要 |
An electrical interconnect including a first circuitry layer with a first surface and a second surface. A first liquid dielectric layer is imaged directly on the first surface of the first circuitry layer to form a first dielectric layer with a plurality of first recesses. Conductive plating substantially fills a plurality of the first recesses to create a plurality of first solid copper conductive pillars electrically coupled to, and extending generally perpendicular to, the first circuitry layer. A second liquid dielectric layer is imaged directly on the first dielectric layer to form a second dielectric layer with a plurality of second recesses. Conductive plating substantially fills a plurality of the second recesses to form a plurality of second solid copper conductive pillars electrically coupled to, and extending parallel with, the first conductive pillars. An IC device is electrically coupled to a plurality of the second conductive pillars. |
申请公布号 |
US2014225255(A1) |
申请公布日期 |
2014.08.14 |
申请号 |
US201414255083 |
申请日期 |
2014.04.17 |
申请人 |
HSIO TECHNOLOGIES, LLC |
发明人 |
RATHBURN JIM |
分类号 |
H01L23/12;H05K1/11;H05K1/02;H01L23/00 |
主分类号 |
H01L23/12 |
代理机构 |
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代理人 |
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主权项 |
1. An electrical interconnect comprising:
a first circuitry layer comprising a first surface and a second surface; a first liquid dielectric layer imaged directly on the first surface of the first circuitry layer to form a first dielectric layer with a plurality of first recesses; a conductive plating that substantially fills a plurality of the first recesses comprising a plurality of first solid copper conductive pillars electrically coupled to, and extending generally perpendicular to, the first circuitry layer; a second liquid dielectric layer imaged directly on the first dielectric layer to form a second dielectric layer with a plurality of second recesses; a conductive plating that substantially fills a plurality of the second recesses comprising a plurality of second solid copper conductive pillars electrically coupled to, and extending parallel with, the first conductive pillars; and an IC device electrically coupled to a plurality of the second conductive pillars. |
地址 |
MAPLE GROVE MN US |