发明名称 Semiconductor Constructions, DRAM Arrays, and Methods of Forming Semiconductor Constructions
摘要 The invention includes methods for utilizing partial silicon-on-insulator (SOI) technology in combination with fin field effect transistor (finFET) technology to form transistors particularly suitable for utilization in dynamic random access memory (DRAM) arrays. The invention also includes DRAM arrays having low rates of refresh. Additionally, the invention includes semiconductor constructions containing transistors with horizontally-opposing source/drain regions and channel regions between the source/drain regions. The transistors can include gates that encircle at least three-fourths of at least portions of the channel regions, and in some aspects can include gates that encircle substantially an entirety of at least portions of the channel regions.
申请公布号 US2014225175(A1) 申请公布日期 2014.08.14
申请号 US201414254720 申请日期 2014.04.16
申请人 Micron Technology, Inc. 发明人 Fischer Mark
分类号 H01L27/108 主分类号 H01L27/108
代理机构 代理人
主权项
地址 Boise ID US